Electromigration on Signal Interconnects (20140089, Dr. Sachin Sapatnekar)
Efficiently Characterizes Cell-internal Electromigration
The problem of cell-internal electromigration (EM) on signal interconnects within a standard cell is solved using this technology which efficiently characterizes EM characteristics of gates in a standard cell library, under all pin positions, based on a single circuit simulation and graph-based methods. The approach uses Joule heating effects to model and efficiently characterize cell-internal EM to analyze the lifetime of large benchmark circuits. A related method optimizes circuit lifetime by changing pin positions in gates within a circuit. This procedure has demonstrated an approximate 60% increase in circuit lifetime.
Optimization of Circuit Lifetime
Standard cell-based gate libraries are the bedrock of integrated circuit design. Electromigration (EM) in on-chip metal interconnects is a critical reliability failure mechanism in nanometer-scale technologies and is an increasing problem in integrated circuits that reduces circuit lifetime. Traditionally, EM affected global wires, but in current and future technologies, within-gate wires will also be significantly affected. Currently, EM checks in existing technologies are performed ad hoc; no current methods systematically perform cell-internal EM or allocate pin positions to increase the lifetime of a circuit that uses numerous standard cells. This technology provides a systematic and computationally efficient way for analyzing cell-level EM and translating it to an analysis and optimization of circuit level lifetimes.
BENEFITS AND FEATURES:
- Models and efficiently characterizes cell-internal EM
- Characterizes EM characteristics of gates in a standard cell library under all pin positions
- Analyzes lifetime of large benchmark circuits
- Optimizes circuit lifetime
- Joule heating effects
- Solves cell-internal EM problems
- Approximate 60% increase in circuit lifetime
- Integrated circuit design
- Circuit design
Phase of Development - Prototype devResearchers
|Interested in Licensing?|
|The University relies on industry partners to scale up technologies to large enough production capacity for commercial purposes. The license is available for this technology and would be for the sale, manufacture or use of products claimed by the issued patents. Please contact us to share your business needs and technical interest in this technology and if you are interested in licensing the technology for further research and development.|
swap_vertical_circlecloud_downloadSupporting documents (0)Additional files may be available once you've completed the transaction for this product. If you've already done so, please log into your account and visit My account / Downloads section to view them.